Test system for wide bandgap semiconductors

October 12, 2020 //By Nick Flaherty
The Keithley S530 Series Parametric Test System with KTE 7 software enables semiconductor fabs to add parametric test capacity for SiC and GaN devices
The Keithley S530 Series Parametric Test System with KTE 7 software enables semiconductor fabs to add parametric test capacity for SiC and GaN devices

Tektronix has launched a test system optimised for wide bandgap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN). 

The Keithley S530 Series Parametric Test System with KTE 7 software enables semiconductor fabs to add parametric test capacity for such devices.

New semiconductor products based on emerging wide bandgap (WBG) technologies such as GaN and SiC offer the promise of faster switching speeds, wider temperature ranges, better power efficiency, and other benefits. To meet testing needs for these products, the KTE 7-based S530 platform boasts lab-grade measurement performance with minimal set-up and test time. High-speed, fully flexible configurations up to 1100V can evolve as new applications emerge and requirements change. This allows chip manufacturers to cost-effectively and efficiently expand into high-growth power and WBG devices (including the automotive market), with minimal test/set-up time, on a single system, and with minimal investment.

"Analog and mixed-signal semiconductor manufacturers continue to experience strong demand from new end-use applications in 5G communications, automotive, IoT, medical, green energy, and other markets," said Chris Bohn, vice president and general manager at Keithley/Tektronix. "This significant test platform update helps those customers bring new products to market more quickly and cost-effectively, while giving them the agility to adapt to new requirements in the future."

Innovations to the S530 Series maximize tester utilisation over a wide product mix, and easily migrate existing test software, probe cards and other items, while offering full data correlation along with significant speed improvements. The S530-HV model enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications.

This allows chip manufacturers can test a wide mix of products with a single system, including automotive products per the IATF-16949 quality management standard. Calibration can be performed with minimal downtime in-house or through Tektronix's service organization.

The KTE7-based platform offers semiconductor manufacturers the easiest and most cost-effective migration path from legacy S600


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